• DocumentCode
    1847905
  • Title

    A hybrid self-testing methodology of processor cores

  • Author

    Lu, Tai-Hua ; Chen, Chung-Ho ; Lee, Kuen-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    3378
  • Lastpage
    3381
  • Abstract
    Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new SBST methodology that uses information abstracted from the processor instruction set architecture (ISA), pipeline architecture model, RTL descriptions, and gate-level net-list for test program development of different types of the processor circuitry. This paper demonstrates the feasibility of the proposed methodology by the achieved fault coverage on a complex pipeline processor core. Comparisons with previous work are also made. Experimental results show its potential as an effective method for practical use.
  • Keywords
    automatic test software; embedded systems; instruction sets; microprocessor chips; system-on-chip; at-speed testing; embedded processor cores; fault coverage; gate-level net-list; instruction set architecture; software-based self-test; system-on-chip; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Embedded computing; Microprocessors; Pipelines; Software testing; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542183
  • Filename
    4542183