DocumentCode

1848796

Title

A functional model for test sequence generation

Author

Koh, Liang-Seng ; Wang, Chang-Jia ; Liu, Ming T.

fYear

1994

fDate

12-15 April 1994

Firstpage

336

Keywords

Automata; Contracts; Degradation; Flow graphs; Information science; Protocols; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computers and Communications, 1994., IEEE 13th Annual International Phoenix Conference on

Conference_Location

Phoenix, AZ, USA

Print_ISBN

0-7803-1814-5

Type

conf

DOI

10.1109/PCCC.1994.504135

Filename

504135