DocumentCode
1848960
Title
Microwave Electric-Field Mapping Using Optical-Fiber-Mounted Electro-Optic Probes
Author
Yang, K. ; Whitaker, J.F. ; Katehi, L.P.B.
Author_Institution
Radiation Laboratory and Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan, USA
Volume
38
fYear
2000
fDate
Nov. 2000
Firstpage
1
Lastpage
6
Abstract
A microwave electric-field mapping system based on electro-optic sampling has been developed using micromachined gallium arsenide crystals mounted on gradient-index lenses and single-mode optical fibers. Three orthogonal polarization components of the electric field are distinguished, and two-dimensional field images are obtained by scanning the fiber-based probes in a plane above the device under test. Because the probes are simple dielectrics and require no metal or electrodes to extract the electric field amplitude and phase, they are uniquely useful in the imaging of the aperture-plane region of antennas and arrays, where they provide complete information on radiated, guided, and evanescent waves. Due to the high level of versatility afforded by the optical-fiber coupling, this diagnostic testing can be extended not only to open, guided-wave structures, but also to shielded microwave circuits and packages.
Keywords
Circuit testing; Crystals; Gallium arsenide; Image sampling; Microwave devices; Optical fiber polarization; Optical fiber testing; Optical surface waves; Phased arrays; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 56th
Conference_Location
Boulder, AZ, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2000.327437
Filename
4120136
Link To Document