• DocumentCode
    1850634
  • Title

    LLNL flash X-ray radiography machine (FXR) double-pulse upgrade diagnostics

  • Author

    Ong, Mike ; Avalle, Carlos ; Richardson, Roger ; Zentler, Jan

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    June 29 1997-July 2 1997
  • Firstpage
    430
  • Abstract
    When the FXR machine was first tuned on the 1980s, a minimal amount of diagnostics was available and consisted mostly of power monitors. During the accelerator upgrade, additional beam diagnostics were added. The sensor upgrades included beam bugs (resistive wall beam motion sensors) and high-frequency B-dot. Even with this suite of measurement tools, tuning was difficult. For the current double-pulse upgrade, beam transport is a more complex problem-the beam characteristics must be measured better. Streak and framing cameras, which measure beam size and motions, are being added. Characterization of the beam along the entire accelerator is expected and other techniques are also evaluated. Each sensor has limitations and only provides a piece of the puzzle. Besides providing more beam data, the set of diagnostics used should be broad enough so results can be cross validated. Results are also compared to theoretical calculations and computer models, and successes and difficulties are reported.
  • Keywords
    collective accelerators; particle beam diagnostics; radiography; streak cameras; FXR machine; beam characteristics measurement; beam motion measurement; beam size measurement; beam transport; computer models; diagnostics; double-pulse upgrade diagnostics; flash X-ray radiography machine; framing cameras; induction linear accelerator; streak cameras; Cameras; Computer bugs; Diagnostic radiography; Electron accelerators; Laboratories; Linear accelerators; Particle accelerators; Particle beams; Sensor phenomena and characterization; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
  • Conference_Location
    Baltimore, MA, USA
  • Print_ISBN
    0-7803-4213-5
  • Type

    conf

  • DOI
    10.1109/PPC.1997.679369
  • Filename
    679369