• DocumentCode
    1850791
  • Title

    Surge endurance capability testing of supercapacitor families

  • Author

    Kularatna, Nihal ; Fernando, Jayathu ; Pandey, Amit

  • Author_Institution
    Univ. of Waikato, Hamilton, New Zealand
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    1858
  • Lastpage
    1863
  • Abstract
    Supercapacitors are usually low voltage, high capacity devices with milliohm order equivalent series resistances. They usually have time constants from fractional seconds to seconds. Due to these long time constants, compared to the time durations of power line transients in the range of few microseconds to several 100 microseconds, these devices may be able to withstand short duration surges with energy values specified in IEEE C62-41 series and IEC 61400-4-5 and similar standards. However there is little or no manufacturer data sheet information on these aspects. The paper provides the details of a test procedure to test the surge withstand capability of supercapacitors. In addition, essential details of a customized tester interface required for a lightning surge simulator and surge-endurance test results for three supercapacitor families are also presented.
  • Keywords
    IEC standards; IEEE standards; lightning protection; supercapacitors; surge protection; IEC 61400-4-5; IEEE C62-41; customized tester interface; equivalent series resistances; lightning surge simulator; manufacturer data sheet information; power line transients; supercapacitor families; surge endurance capability testing; time constants; Equivalent circuits; Integrated circuit modeling; Supercapacitors; Surge protection; Surges; Supercapacitors; lightning surge simulator; power conditioning systems; transient propagation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5675392
  • Filename
    5675392