• DocumentCode
    1851768
  • Title

    Performances of SI GaAs detectors fabricated with a new technology

  • Author

    Nava, F. ; Alietti, M. ; Canali, C. ; Cavallini, A. ; Papa, C. Del ; Re, V. ; Lanzieri, C.

  • Author_Institution
    Dipartimento di Fisica, Modena Univ., Italy
  • Volume
    1
  • fYear
    1995
  • fDate
    21-28 Oct 1995
  • Firstpage
    380
  • Abstract
    The non complete charge collection efficiency observed in Semi-Insulating (SI) Gallium Arsenide (GaAs) particle detectors has been generally attributed to trapping effects. However most of the detectors analyzed in literature can only operate below the depletion voltage. We present a careful analysis of the output signal and of performances of SI GaAs detectors, operated below and above full depletion and irradiated with 241Am α particles. When the detector is biased below full depletion the output signals are affected by the undepleted part of the detector itself, while, when the detector is operated above the full depletion, the output signals are only affected by trapping-detrapping of charge carriers. Trapping-detrapping effects are in agreement with the analysis of deep levels present in the detectors. An energy resolution of 1.1% has been achieved with an 241Am α source
  • Keywords
    III-V semiconductors; alpha-particle detection; deep levels; electron traps; gallium arsenide; hole traps; semiconductor counters; GaAs; alpha-particle irradiation; charge carriers; deep levels; depletion voltage; noncomplete charge collection efficiency; semi-insulating gallium arsenide particle detectors; trapping effects; trapping-detrapping; Charge carriers; Energy resolution; Gallium arsenide; Irrigation; Ohmic contacts; Performance analysis; Radiation detectors; Signal analysis; Silicon radiation detectors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3180-X
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1995.504249
  • Filename
    504249