DocumentCode
1852324
Title
Measuring edge scattering from finite-sized samples using a Gaussian beam
Author
Petersson, L.E.R. ; Smith, G.S.
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
4
fYear
2003
fDate
22-27 June 2003
Firstpage
62
Abstract
In this paper, we examine the possibility of measuring edge scattering from a material by using a Gaussian beam together with a finite-sized sample of the material. A practical implementation for measuring edge scattering is shown. Here a focused beam system, consisting of a horn antenna and a lens, produces a beam that closely resembles a Gaussian beam. The waist of the beam is centered on one edge of a finite-sized object. The object is often a thin, flat rectangular plate of some material that is being investigated for the purpose of minimizing edge scattering. The scattered field is measured, either close to or far from the object, to determine the characteristics of the edge scattering. With this system, various treatments can be applied to the edge while observing the change in the scattering. In this paper, we analyze a canonical problem. Results from this analysis are used to obtain guidelines for the conditions under which the scattering from the illuminated edge can be isolated from the scattering from the remainder of the object, viz, from the other edges of the plate.
Keywords
antenna radiation patterns; electromagnetic wave scattering; focusing; horn antennas; E-beam; Gaussian beam; H-beam; beam waist; canonical problem; edge scattering; electromagnetic beam; far-zone patterns; finite-sized sample; flat rectangular plate; focused beam system; horn antenna; illuminated edge; perfectly conducting plate; plane waves; Antenna measurements; Beams; Contracts; Electric variables measurement; Electromagnetic measurements; Electromagnetic scattering; Guidelines; Laboratories; Lenses; Optical materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location
Columbus, OH, USA
Print_ISBN
0-7803-7846-6
Type
conf
DOI
10.1109/APS.2003.1220120
Filename
1220120
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