• DocumentCode
    1852612
  • Title

    Embedding infrastructure IP for SOC yield improvement

  • Author

    Zorian, Yervant

  • Author_Institution
    Virage Logic, Fremont, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    709
  • Lastpage
    712
  • Abstract
    In addition to the functional IP cores, today´s SOC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SOC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This paper analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. It also describes several examples of such embedded IPs for detection, analysis and correction
  • Keywords
    application specific integrated circuits; design for manufacture; fault tolerance; industrial property; integrated circuit reliability; integrated circuit yield; SOC yield; design phase; fault tolerance; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing susceptibility; reliability; Electronics industry; Fabrication; Fault tolerance; Logic; Manufacturing; Permission; Production; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • Conference_Location
    New Orleans, LA
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012716
  • Filename
    1012716