DocumentCode
1852612
Title
Embedding infrastructure IP for SOC yield improvement
Author
Zorian, Yervant
Author_Institution
Virage Logic, Fremont, CA, USA
fYear
2002
fDate
2002
Firstpage
709
Lastpage
712
Abstract
In addition to the functional IP cores, today´s SOC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SOC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This paper analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. It also describes several examples of such embedded IPs for detection, analysis and correction
Keywords
application specific integrated circuits; design for manufacture; fault tolerance; industrial property; integrated circuit reliability; integrated circuit yield; SOC yield; design phase; fault tolerance; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing susceptibility; reliability; Electronics industry; Fabrication; Fault tolerance; Logic; Manufacturing; Permission; Production; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location
New Orleans, LA
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012716
Filename
1012716
Link To Document