• DocumentCode
    1853492
  • Title

    Electromagnetic analysis of active radar absorbers

  • Author

    Kaleeba, P.N. ; Tennant, A. ; Chambers, B. ; Idez, J.P.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, UK
  • Volume
    4
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    295
  • Abstract
    The details of an experimental active radar absorber have been presented. The absorber is based on the topology of a Salisbury screen but uses an active impedance layer to provide reflectivity tuning. The active impedance layer is a FSS controlled by semiconductor pin diodes. Measured reflectivity characteristics have been presented and compared to predictions obtained from a simple equivalent circuit transmission line model. The structure has also been analysed using the Ansoft HFSS electromagnetic simulator software in which the diode has been modelled by a small planar slab of material with variable surface impedance. This model provides superior result to the transmission line model in predicting the resonance frequencies of the FSS.
  • Keywords
    adaptive radar; computational electromagnetics; electromagnetic wave absorption; electromagnetic wave transmission; equivalent circuits; frequency selective surfaces; periodic structures; radar cross-sections; radar equipment; reflectivity; surface impedance; FSS; Salisbury screen; active impedance layer; active radar absorber; bow-tie dipole elements; electromagnetic simulator; equivalent circuit transmission line model; microwave absorbers; periodic structure; rectangular lattice; reflectivity tuning; resonance frequencies; small planar slab; smart radar absorber; variable surface impedance; Circuit optimization; Circuit topology; Distributed parameter circuits; Electromagnetic analysis; Frequency selective surfaces; Impedance; Planar transmission lines; Predictive models; Radar; Reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220178
  • Filename
    1220178