• DocumentCode
    1853736
  • Title

    Polarization-analyzing image sensor based on standard CMOS technology

  • Author

    Tokuda, T. ; Yamada, H. ; Sasagawa, K. ; Ohta, J.

  • Author_Institution
    Nara Inst. of Sci. & Technol., Ikoma, Japan
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    331
  • Lastpage
    333
  • Abstract
    In this work, we propose and demonstrate a technology to realize polarization-analyzing CMOS image sensors. We developed a polarization-analyzing pixel with embedded polarizers. We characterize the performances of the sensor and demonstrate its functionality in polarimetric measurement of chiral solutions.
  • Keywords
    CMOS image sensors; optical polarisers; polarimetry; CMOS image sensor technology; embedded polarizer; polarimetric measurement; polarization-analyzing image sensor; CMOS image sensors; CMOS process; CMOS technology; Image sensors; Optical polarization; Photodiodes; Pixel; Sensor arrays; Sensor phenomena and characterization; Space technology; µTAS; CMOS image sensor; chiral measurement; polarimetric measurement; polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285497
  • Filename
    5285497