• DocumentCode
    1855091
  • Title

    The history of automotive EM research at the OSU ElectroScience Laboratory

  • Author

    Walton, E.K.

  • Author_Institution
    ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
  • Volume
    4
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    582
  • Abstract
    The ElectroScience Laboratory has a long history of automotive antenna and EM research. Today, one can buy a car with antennas for AM, FM, FM diversity, 4-way diversity TV, GPS, cellular, satellite, digital keyless entry, garage door opener, automatic toll, and radar. Radar applications include backup warning, side airbag deployment, intelligent cruise control, collision warning and automatic driving. The antennas must be very low cost (sometimes zero cost) and must be acceptable to the consumer (often invisible). We have also studied electromagnetic interference due to electrical systems on the vehicle, and electromagnetic compatibility issues. The ElectroScience laboratory has been involved in all of these applications. This paper will discuss the history of the involvement of the ESL and the types of projects and techniques that the ESL has evolved to solve these problems.
  • Keywords
    antenna radiation patterns; antenna testing; antenna theory; computational electromagnetics; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; method of moments; mobile antennas; radar antennas; road vehicle radar; FDTD computations; antenna under test; automotive EM research; automotive antennas; automotive radar; computational techniques; electromagnetic compatibility; electromagnetic interference; gain pattern measurements; method of moments code; mobile measurement system; Automotive engineering; Costs; Global Positioning System; History; Laboratories; Radar antennas; Satellite antennas; Satellite broadcasting; Spaceborne radar; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220340
  • Filename
    1220340