• DocumentCode
    1857856
  • Title

    Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method

  • Author

    Khusyari, Khairul ; Ng, Wei Tee ; Jaarsma, Neal ; Abraham, Robert ; Ng, Peng Weng ; Ang, Boon Hui ; Ong, Chin Hu

  • fYear
    2008
  • fDate
    24-27 Nov. 2008
  • Firstpage
    271
  • Lastpage
    271
  • Abstract
    In this paper, the scan chain diagnosis using the VBUMP Scan Debug method is presented. This diagnosis approach controls the DUT VDD during the scan shifting operation by using ATE VBUMP utility to assist in silicon debug.
  • Keywords
    automatic test equipment; failure analysis; integrated circuit testing; logic testing; ATE VBUMP utility; VBUMP scan debug method; logic failure; scan chain diagnosis; scan shifting operation; silicon debug; Application specific integrated circuits; Failure analysis; Fault diagnosis; Hardware; Low voltage; Semiconductor device testing; Signal analysis; Silicon; Test pattern generators; Timing; VBUMP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • Conference_Location
    Sapporo
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.66
  • Filename
    4711602
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1857856