DocumentCode
1858149
Title
Selective quantum dot intermixing for photonic devices
Author
Bryce, A. Catrina ; Marsh, John H. ; Yanson, Dan A. ; Kowalski, Olek P. ; Kim, Shin-Sung
Author_Institution
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear
2005
fDate
11-15 July 2005
Firstpage
386
Abstract
Dielectric-cap-based techniques, originally developed for quantum well intermixing, have been applied to the intermixing of InGaAs/GaAs/AlGaAs QD material with an emission wavelength of 1280 nm. Intermixing was achieved by sputtering a QDI-enhancing cap in some areas, and plasma deposition of silica QDI-suppressing cap in other areas, followed by a high-temperature anneal cycle. Extremely large bandgap blue-shifts of up to 280 nm have been obtained with an anneal temperature of 800 C. Selected intermixing was obtained by varying the coverage density of QDI-enhancing features over that of QDI-suppressing ones.
Keywords
III-V semiconductors; aluminium compounds; annealing; gallium arsenide; indium compounds; plasma deposition; semiconductor lasers; semiconductor quantum dots; semiconductor quantum wells; sputtering; 1280 nm; 800 C; InGaAs-GaAs-AlGaAs; InGaAs-GaAs-AlGaAs QD material; blue-shifts; dielectric-cap-based techniques; emission wavelength; high-temperature anneal cycle; photonic devices; photonic integration; plasma deposition; quantum dot intermixing; quantum well intermixing; semiconductor laser; sputtering; Annealing; Dielectric materials; Gallium arsenide; Indium gallium arsenide; Plasma density; Plasma devices; Plasma materials processing; Plasma temperature; Quantum dots; Sputtering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN
0-7803-9199-3
Type
conf
DOI
10.1109/NANO.2005.1500777
Filename
1500777
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