• DocumentCode
    185818
  • Title

    Finite element analysis of anchor loss in AlN Lamb wave resonators

  • Author

    Yung-Yu Chen ; Yen-Ting Lai ; Chih-Ming Lin

  • Author_Institution
    Dept. of Mech. Eng., Tatung Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    19-22 May 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Acoustic energy leakage through support tethers into the substrate, known as anchor loss, decreases the quality factors (Q) of micromechanical aluminum nitride (AlN) Lamb wave resonators. In this work, we present a theoretical study on the anchor loss of the AlN Lamb wave resonators by using the perfect matched layer (PML) approach in the finite element analysis (FEA) simulation. The anchor loss Q´s of the resonator with different anchor widths and lengths were theoretically calculated and compared. The tether geometries significantly affect the anchor loss Q when the interdigital transducer (IDT) widths are equal to 5.4 and 4.44 μm and less influence the anchor loss Q while the IDT width equals 2.77 μm. The results indicate that the anchor loss dominates the loss mechanism in the Lamb wave resonator at low frequencies and other damping sources decrease the Q at high frequencies. The PML-based FEA method is also utilized to compute the anchor loss Q´s of the Lamb wave resonators utilizing the flat and convex free edges, showing good agreement with the experimental Q´s in the literature.
  • Keywords
    III-V semiconductors; damping; finite element analysis; interdigital transducers; surface acoustic wave resonators; surface acoustic wave transducers; wide band gap semiconductors; AlN; FEA simulation; IDT; PML approach; acoustic energy leakage; anchor loss; convex free edge; damping source; finite element analysis simulation; flat free edge; interdigital transducer; micromechanical aluminum nitride lamb wave resonator; perfect matched layer approach; quality factor; size 4.44 mum; size 5.4 mum; tether geometry; Acoustic waves; Admittance; III-V semiconductor materials; Loss measurement; Micromechanical devices; Q-factor; Resonant frequency; Lamb wave resonator; aluminum nitride; anchor loss; convex free edge; finite element analysis; perfectly matched layer; quality factor; tether loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2014 IEEE International
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/FCS.2014.6859875
  • Filename
    6859875