• DocumentCode
    1859506
  • Title

    Dealing with the multitudes of legacy TPSs

  • Author

    McQuillen, Tracy

  • Author_Institution
    EADS North America Test & Services, Irvine, CA, USA
  • fYear
    2012
  • fDate
    10-13 Sept. 2012
  • Firstpage
    169
  • Lastpage
    173
  • Abstract
    For the most part, our military´s legacy Test Program Sets (TPSs) are written in some derivative of IEEE Std 416/716 ATLAS (called adapted subsets, e.g. CASS ATLAS). Some have been in use for 30 years. As the hosting ATE systems are wearing out, we are faced with upgrading the hardware to support the legacy systems as well as technology insertion via system upgrades or new systems/subsystems being designed. From a software perspective, there are many avenues to be taken to “modernize” the legacy TPSs for the future. : Stay with the legacy adapted ATLAS subset. : Re-host in an industry standard ATLAS system. : Translate into another standard such as ATML with a “Carrier” language. : Rewrite from scratch into “C/C++/C#”. : Re-implement in a bench tester “Graphic/drag and drop” type system. : Or some combination of all of the above. The goals are the same no matter which method is chosen. Create a suite of TPSs that will support the legacy “black boxes” and future “black boxes”, and that are maintainable for the next 30 years. This paper discusses the various approaches and some of the pitfalls we may encounter.
  • Keywords
    C++ language; IEEE standards; automatic test equipment; military computing; program testing; rewriting systems; software maintenance; ATE systems; ATML; C language; C# language; C++ language; Carrier language; IEEE Std 416/716 ATLAS; adapted subsets; automatic test equipment; bench tester; black boxes; graphic-drag and drop type system; industry standard ATLAS system; legacy TPS; legacy adapted ATLAS subset; military legacy test program set; technology insertion; Control systems; Hardware; Instruments; Production; Software; Standards; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-0698-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.2012.6334545
  • Filename
    6334545