• DocumentCode
    1860138
  • Title

    A bit level area aware cache-based architecture for memory repairs

  • Author

    Axelos, Nicholas ; Pekmestzi, Kiamal

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    154
  • Lastpage
    158
  • Abstract
    In this paper an architecture for memory Built-In Self-Repair (BISR) is presented. The proposed scheme utilises a multiple bank cache-like memory for repairing defective bits and is a heavily modified version of a previously studied architecture that repaired at the word level, while the proposed repairs at the bit level. This scheme achieves high repair ratios at high defect densities with small overheads. The two architectures are compared on their footprint by means of an area approximation analysis. The proposed modified scheme shows significant area savings (greater than 4 times) while retaining the same high repairability qualities as its predecessor.
  • Keywords
    cache storage; fault tolerant computing; maintenance engineering; memory architecture; area approximation analysis; bit level area aware cache based architecture; defective bits repairing; memory built in self repair; multiple bank cache memory; Circuit faults; Computer architecture; Maintenance engineering; Multiplexing; Random access memory; Redundancy; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
  • Conference_Location
    Corfu
  • Print_ISBN
    978-1-4244-7724-1
  • Type

    conf

  • DOI
    10.1109/IOLTS.2010.5560217
  • Filename
    5560217