DocumentCode
1860206
Title
Reliability prediction of electronic packages
Author
Dasgupta, Abhijit ; Barker, Donald ; Pecht, Michael
Author_Institution
Maryland Univ., College Park, MD, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
323
Lastpage
330
Abstract
An overview is presented of the state of the art in generating analytical models for fatigue life estimation due to mechanical wear-out. The applicability of these models to reliability prediction for electronic packages is examined. In discussing the failure mechanics of common electronic materials, it is convenient to classify the fatigue damage models into brittle damage, ductile damage, and damage in heterogeneous composite materials. Often the failure may not be in the bulk of any individual material but at the interface of two or more materials, and may require a fourth type of damage model
Keywords
failure analysis; packaging; reliability; brittle damage; ductile damage; electronic packages; failure analysis; fatigue life estimation; heterogeneous composite materials; mechanical wear-out; models; reliability; state of the art; Composite materials; Educational institutions; Electronic packaging thermal management; Electronics industry; Electronics packaging; Fatigue; Predictive models; Process design; Thermal loading; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1990.67977
Filename
67977
Link To Document