• DocumentCode
    1860206
  • Title

    Reliability prediction of electronic packages

  • Author

    Dasgupta, Abhijit ; Barker, Donald ; Pecht, Michael

  • Author_Institution
    Maryland Univ., College Park, MD, USA
  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    323
  • Lastpage
    330
  • Abstract
    An overview is presented of the state of the art in generating analytical models for fatigue life estimation due to mechanical wear-out. The applicability of these models to reliability prediction for electronic packages is examined. In discussing the failure mechanics of common electronic materials, it is convenient to classify the fatigue damage models into brittle damage, ductile damage, and damage in heterogeneous composite materials. Often the failure may not be in the bulk of any individual material but at the interface of two or more materials, and may require a fourth type of damage model
  • Keywords
    failure analysis; packaging; reliability; brittle damage; ductile damage; electronic packages; failure analysis; fatigue life estimation; heterogeneous composite materials; mechanical wear-out; models; reliability; state of the art; Composite materials; Educational institutions; Electronic packaging thermal management; Electronics industry; Electronics packaging; Fatigue; Predictive models; Process design; Thermal loading; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1990. Proceedings., Annual
  • Conference_Location
    Los Angeles, CA
  • Type

    conf

  • DOI
    10.1109/ARMS.1990.67977
  • Filename
    67977