• DocumentCode
    1860449
  • Title

    Electrostatic lens characterization through nanorobotic manipulation

  • Author

    Liu, Pou ; Arai, Fumihito ; Saito, Yahachi ; Fukuda, Toshio

  • Author_Institution
    Nagoya Univ., Japan
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    729
  • Abstract
    Carbon nanotube can be used as an emitter for electron-beam-induced deposition, but the electron beam size is limited to micro scale and therefore cannot he used for creating 3D structures with high resolution. In order to focus the electron beam we created a single hole electrostatic lens and determined its characteristics through nanorobotic manipulation. We used a carbon nanotube bundle as emitter and measured its field emission property. The focused effect of the electrostatic lens was demonstrated through a series of electron beam patterns observed in real time with a field emission microscope inside a scanning electron microscope.
  • Keywords
    carbon nanotubes; electron beam deposition; electrostatic lenses; field emission electron microscopy; scanning electron microscopy; carbon nanotube; electron beam size; electron-beam-induced deposition; electrostatic lens; emitter; field emission microscope; nanorobotic manipulation; scanning electron microscope; Carbon nanotubes; Electron beams; Electron emission; Electron microscopy; Electrostatic measurements; Flat panel displays; Lenses; Magnetic field measurement; Scanning electron microscopy; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2005. 5th IEEE Conference on
  • Print_ISBN
    0-7803-9199-3
  • Type

    conf

  • DOI
    10.1109/NANO.2005.1500869
  • Filename
    1500869