DocumentCode
1860449
Title
Electrostatic lens characterization through nanorobotic manipulation
Author
Liu, Pou ; Arai, Fumihito ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution
Nagoya Univ., Japan
fYear
2005
fDate
11-15 July 2005
Firstpage
729
Abstract
Carbon nanotube can be used as an emitter for electron-beam-induced deposition, but the electron beam size is limited to micro scale and therefore cannot he used for creating 3D structures with high resolution. In order to focus the electron beam we created a single hole electrostatic lens and determined its characteristics through nanorobotic manipulation. We used a carbon nanotube bundle as emitter and measured its field emission property. The focused effect of the electrostatic lens was demonstrated through a series of electron beam patterns observed in real time with a field emission microscope inside a scanning electron microscope.
Keywords
carbon nanotubes; electron beam deposition; electrostatic lenses; field emission electron microscopy; scanning electron microscopy; carbon nanotube; electron beam size; electron-beam-induced deposition; electrostatic lens; emitter; field emission microscope; nanorobotic manipulation; scanning electron microscope; Carbon nanotubes; Electron beams; Electron emission; Electron microscopy; Electrostatic measurements; Flat panel displays; Lenses; Magnetic field measurement; Scanning electron microscopy; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN
0-7803-9199-3
Type
conf
DOI
10.1109/NANO.2005.1500869
Filename
1500869
Link To Document