• DocumentCode
    1861700
  • Title

    Electromagnetic characterization of barium ferrite thick film samples in the KP band

  • Author

    Jakab, László ; Berceli, Tibor

  • Author_Institution
    Dept. of Broadband Inf. Commun. & EM Theor., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2011
  • fDate
    10-13 Aug. 2011
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    A method for the broadband measurement of the complex permittivity of barium ferrite (BaF) thick film samples in a partially filled rectangular waveguide is presented. The material characterization is based on the measurement of the reflection and the transmission coefficients of the rectangular waveguide containing the demagnetized ferrite sample. We present the detailed numerical method for the calculation of the complex permittivity from the measured scattering matrix. First the propagation constant is deduced from the scattering parameters followed by the determination of the cutoff wavenumber for the partially filled section of the waveguide. Finally, the material parameters are calculated based on the analytical solution of the partially filled waveguide. The method is verified by 3-D electromagnetic simulation tools and by reference measurements on known samples.
  • Keywords
    S-parameters; barium compounds; electromagnetic wave reflection; electromagnetic wave transmission; permittivity measurement; rectangular waveguides; thick films; 3D electromagnetic simulation tools; barium ferrite thick film samples; broadband measurement; complex permittivity; cutoff wavenumber; demagnetized ferrite sample; electromagnetic characterization; material characterization; numerical method; partially-filled rectangular waveguide; propagation constant; reflection coefficient measurement; scattering matrix measurement; transmission coefficient measurement; Electromagnetic waveguides; Materials; Microwave measurements; Microwave theory and techniques; Permittivity; Permittivity measurement; Propagation constant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electromagnetics International Workshop (CEM), 2011
  • Conference_Location
    Izmir
  • Print_ISBN
    978-1-4577-1685-0
  • Type

    conf

  • DOI
    10.1109/CEM.2011.6047343
  • Filename
    6047343