• DocumentCode
    1861834
  • Title

    High-Q, gallium nitride nanowire-ALD composite mechanical resonators

  • Author

    Montague, J.R. ; Seghete, D. ; Bertness, K.A. ; Sanford, N.A. ; George, S.A. ; Bright, V.M. ; Rogers, C.T.

  • Author_Institution
    Dept. of Phys., Univ. of Colorado, Boulder, CO, USA
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    1437
  • Lastpage
    1440
  • Abstract
    We are investigating high quality-factor, Q, gallium nitride (GaN) nanowire (NW) - atomic layer deposition (ALD) composite nano-electromechanical resonators. GaN-NWs of typical 100 nm radius and a few microns length are single crystal structures grown by molecular beam epitaxy. These NWs are singly-clamped cantilevers, resonate near 1 MHz, and have typical Q in the range 104-105 under high vacuum. We are exploring the potential for surface functionalization and resonance frequency tuning of these high-Q resonators through ALD coatings. We report that thin coatings (<10 nm) of ALD Al2O3 lead to a broadening of the GaN-NW fundamental mode resonance peak and a consistent increase in resonance frequency of ~15 kHz per 5 nm ALD.
  • Keywords
    III-V semiconductors; atomic layer deposition; crystal resonators; gallium compounds; molecular beam epitaxial growth; nanowires; piezoelectric oscillations; piezoelectric semiconductors; wide band gap semiconductors; GaN; atomic layer deposition; high-Q resonators; molecular beam epitaxy; nanowire-ALD composite mechanical resonators; piezoelectric oscillations; piezoelectric semiconductors; resonance frequency tuning; wide band gap semiconductors; Aluminum oxide; Atomic layer deposition; Coatings; Gallium nitride; Geometry; III-V semiconductor materials; Molecular beam epitaxial growth; Resonance; Resonant frequency; Tuning; III-V semiconductors; Q-factor; atomic layer deposition; crystal resonators; gallium compounds; molecular beam epitaxial growth; nanoelectronics; nanowires; piezoelectric oscillations; piezoelectric semiconductors; resonators; wide band gap semiconductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285813
  • Filename
    5285813