DocumentCode
1863488
Title
Localized and computationally efficient approach to shift-variant image deblurring
Author
Subbarao, Murali ; Kang, Youn-Sik ; Dutta, Satyaki ; Tu, Xue
Author_Institution
Dept. of Electr. & Comput. Eng., State Univ. of New York, Stony Brook, NY
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
657
Lastpage
660
Abstract
A new localized and computationally efficient approach is presented for shift/space-variant image restoration. Unlike conventional approaches, it models shift-variant blurring in a completely local form based on the recently proposed Rao transform (RT). RT facilitates almost exact inversion of the blurring process locally and permits very fine-grain parallel implementation. The new approach naturally exploits the spatial locality of blurring kernels and smoothness of underlying focused images. It formulates the deblurring problem in terms of local parameters that are less correlated than raw image data. It is a fundamental advance that is general and not limited to any specific form of the blurring kernel such as a Gaussian. It has significant theoretical and computational advantages in comparison with conventional approaches such as those based on singular value decomposition of blurring kernel matrices. Experimental results are presented for both synthetic and real image data. This approach is also relevant to solving integral equations.
Keywords
image restoration; integral equations; matrix algebra; singular value decomposition; Rao transform; fine-grain parallel implementation; image data; image smoothing; integral equation; kernel blurring; kernel matrix; shift-variant image deblurring; singular value decomposition; space-variant image restoration; Algorithm design and analysis; Convolution; Deconvolution; Focusing; Image analysis; Image restoration; Integral equations; Kernel; Optical microscopy; Shape; Deblurring; Deconvolution; Integral Equations; Shift/Space-Variant Image Restoration;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4711840
Filename
4711840
Link To Document