• DocumentCode
    1863753
  • Title

    Electron and proton irradiation effects on substrate-type amorphous silicon solar cells

  • Author

    Sato, Shin-ichiro ; Sai, Hitoshi ; Ohshima, Takeshi ; Imaizumi, Mitsuru ; Shimazaki, Kazunori ; Kondo, Michio

  • Author_Institution
    Japan Atomic Energy Agency (JAEA), Takasaki, Japan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The electrical performances of single-junction hydrogenated amorphous silicon solar cells are investigated following high energy electron and proton irradiation under controlled temperature conditions of 298 and 331 K. Thermal recoveries after irradiation are also studied. As a result, superior radiation tolerance of a-Si:H solar cells compared to crystalline silicon space solar cells is demonstrated. Also, it is clearly shown that the radiation degradation of all the cell parameters; short-circuit current, open-circuit voltage and fill factor are strongly dependent on temperature during irradiation. The thermal recovery after irradiation is observed even at room temperature. These results indicate that the temperature and the elapsed time after irradiation strongly affect the measured performance degradation of a-Si:H solar cells. Therefore, these features must be taken into account and ground radiation tests for making end-of-life predictions should be carried out under the conditions expected on a mission.
  • Keywords
    electron beam effects; hydrogen; proton effects; silicon; solar cells; Si:H; cell parameter; electron irradiation effect; end-of-life predictions; fill factor; open-circuit voltage; proton irradiation effect; radiation degradation; short-circuit current; single junction hydrogenated amorphous silicon solar cells; substrate type amorphous silicon solar cells; temperature 298 K to 331 K; thermal recovery; Degradation; Photovoltaic cells; Protons; Radiation effects; Silicon; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186265
  • Filename
    6186265