DocumentCode
1863753
Title
Electron and proton irradiation effects on substrate-type amorphous silicon solar cells
Author
Sato, Shin-ichiro ; Sai, Hitoshi ; Ohshima, Takeshi ; Imaizumi, Mitsuru ; Shimazaki, Kazunori ; Kondo, Michio
Author_Institution
Japan Atomic Energy Agency (JAEA), Takasaki, Japan
fYear
2011
fDate
19-24 June 2011
Abstract
The electrical performances of single-junction hydrogenated amorphous silicon solar cells are investigated following high energy electron and proton irradiation under controlled temperature conditions of 298 and 331 K. Thermal recoveries after irradiation are also studied. As a result, superior radiation tolerance of a-Si:H solar cells compared to crystalline silicon space solar cells is demonstrated. Also, it is clearly shown that the radiation degradation of all the cell parameters; short-circuit current, open-circuit voltage and fill factor are strongly dependent on temperature during irradiation. The thermal recovery after irradiation is observed even at room temperature. These results indicate that the temperature and the elapsed time after irradiation strongly affect the measured performance degradation of a-Si:H solar cells. Therefore, these features must be taken into account and ground radiation tests for making end-of-life predictions should be carried out under the conditions expected on a mission.
Keywords
electron beam effects; hydrogen; proton effects; silicon; solar cells; Si:H; cell parameter; electron irradiation effect; end-of-life predictions; fill factor; open-circuit voltage; proton irradiation effect; radiation degradation; short-circuit current; single junction hydrogenated amorphous silicon solar cells; substrate type amorphous silicon solar cells; temperature 298 K to 331 K; thermal recovery; Degradation; Photovoltaic cells; Protons; Radiation effects; Silicon; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186265
Filename
6186265
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