• DocumentCode
    1863840
  • Title

    Graph cut segmentation of neuronal structures from transmission electron micrographs

  • Author

    Vu, Nhat ; Manjunath, B.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    725
  • Lastpage
    728
  • Abstract
    In many neurophysiological studies, understanding the neuronal circuitry of the brain requires detailed 3D models of the nerve cells and their synapses. Typically, researchers build the 3D models by manually tracing the 2D cross-sectional profiles of the 3D structures from serial electron micrograph (EM) stacks and then construct the models from these 2D contours. While current computer-aided techniques can reduce the tracing time, they often require extensive user interaction. We propose a segmentation framework to extract the 2D profiles that is both fast and requires a minimal amount of user interaction. The framework uses graph cuts to minimize an energy defined over the image intensity and the flux of the intensity gradient field. Furthermore, to correct segmentation errors, our framework allows for efficient and intuitive editing of the initial results.
  • Keywords
    brain; feature extraction; gradient methods; graph theory; image segmentation; medical image processing; 2D contour; 2D cross-sectional profile; 3D model; brain neuronal circuitry; computer-aided technique; graph cut segmentation; image intensity; intensity gradient field; nerve cell; neurophysiology; transmission electron micrograph; user interaction; Biomembranes; Brain modeling; Circuits; Electrons; Error correction; Image reconstruction; Image segmentation; Informatics; Labeling; Pixel; electron micrograph; flux; graph cuts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711857
  • Filename
    4711857