• DocumentCode
    1864442
  • Title

    Polycrystalline silicon carbide NEMS for high-temperature logic

  • Author

    Lee, T.-H. ; Speer, K.M. ; Fu, X.A. ; Bhunia, S. ; Mehregany, M.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    900
  • Lastpage
    903
  • Abstract
    We report the first ever silicon carbide (SiC) nano-electro-mechanical systems (NEMS) switches capable of operation from 25 to 600degC. We have developed both laterally- and vertically-actuated designs with threshold voltages of less than 5 V. Switches have been verified to cycle more than 3 billion times at room temperature and more than 2 million times at 600degC. Plausible models to describe the contact resistance in two actuation voltage regimes are also suggested: (i) at low actuation voltage, the resistance is dominated by the native oxide which forms on the SiC surface; and (ii) at higher actuation voltages, the resistance can be described by Sharvin´s model.
  • Keywords
    contact resistance; high-temperature electronics; nanoelectromechanical devices; silicon compounds; switches; NEMS switches; SiC; contact resistance; high-temperature logic; nanoelectromechanical systems; polycrystalline silicon carbide NEMS; temperature 25 degC to 600 degC; Contact resistance; Electric resistance; Electrodes; Logic; Nanoelectromechanical systems; Silicon carbide; Surface resistance; Switches; Temperature; Voltage; Contact Resistance; High Temperature; NEMS; Silicon Carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285907
  • Filename
    5285907