• DocumentCode
    1865075
  • Title

    Epitaxial regrowth contacts for the nipi photovoltaic device

  • Author

    Slocum, Michael A. ; Forbes, David V. ; McNatt, J.S. ; Hubbard, Seth M.

  • Author_Institution
    Rochester Inst. of Technol., Rochester, NY, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The simulation and fabrication of a multi-period GaAs n-type I intrinsic I p-type I intrinsic (nipi) doping superlattice solar cell has been demonstrated. A fabrication procedure has been developed using regrown contacts in wet etched V-grooves. Devices have been fabricated and characterized. Current-Voltage measurements in the dark and under one sun AM0 illumination were taken both experimentally and in simulation. Devices with epitaxial regrown contacts having a shunt resistance of 3.17 kΩ, demonstrates an improvement over prior work. Simulations show the potential for high current collection, with non anti-reflection coated AM0 results achieving 24.02 mA/cm2 short circuit current, due to a drift dominated current collection mechanism.
  • Keywords
    III-V semiconductors; epitaxial growth; etching; gallium arsenide; semiconductor growth; semiconductor superlattices; short-circuit currents; solar cells; GaAs; current-voltage measurement; doping superlattice solar cell; drift dominated current collection mechanism; epitaxial regrowth contact; high current collection; nipi photovoltaic device; nonantireflection coated AMO result; resistance 3.17 kohm; short circuit current; shunt resistance; sun AMO illumination; wet etched V-groove; Current measurement; Epitaxial growth; Gallium arsenide; Metallization; Photovoltaic cells; Resistance; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186326
  • Filename
    6186326