• DocumentCode
    1865744
  • Title

    Active surface modeling at CT resolution limits with micro CT ground truth

  • Author

    Bradshaw, Andrew P. ; Todd, Michael J. ; Taubman, David S.

  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1081
  • Lastpage
    1084
  • Abstract
    B-spline active surfaces have been extensively utilized to perform automated feature extraction in medical imaging. In this study we focus our attention on the accuracy of 3D B-spline active surface modeling of very small objects. In particular we investigate different smoothing conditions, based upon the regularization of L1 and L2 norms of surface curvature. The model accuracy is directly determined by ground truth through the use of micro CT, allowing the analysis of real data instead of synthetic data. This study highlights the detrimental effect that results from expansive terms in the energy equation such as the L2 norm and the importance of the point spread function in reconstruction problems where the objects are comparable in size to the resolution of the imaging system.
  • Keywords
    computerised tomography; diagnostic radiography; ear; feature extraction; image reconstruction; image resolution; medical image processing; optical transfer function; smoothing methods; solid modelling; splines (mathematics); surface fitting; 3D B-spline active surface modeling; B-spline; CT resolution limit; L1 norm regularization; L2 norm regularization; feature extraction; image reconstruction; medical imaging; microCT ground truth; point spread function; smoothing condition; Biomedical imaging; Computed tomography; Data analysis; Energy resolution; Equations; Feature extraction; Image reconstruction; Image resolution; Smoothing methods; Spline; Active Contours; B-Spline; CT; Curvature; Ground-Truth; Micro CT; Regularization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711946
  • Filename
    4711946