• DocumentCode
    1866608
  • Title

    Unifying analysis of full reference image quality assessment

  • Author

    Seshadrinathan, Kalpana ; Bovik, Alan C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1200
  • Lastpage
    1203
  • Abstract
    This paper studies two increasingly popular paradigms for image quality assessment - Structural SIMilarity (SSIM) metrics and Information Fidelity metrics. The relation of the SSIM metric to Mean Squared Error and Human Visual System (HVS) based models of quality assessment are studied. The SSIM model is shown to be equivalent to models of contrast gain control of the HVS. We study the information theoretic metrics and show that the Information Fidelity Criterion (IFC) is a monotonic function of the structure term of the SSIM index applied in the sub-band filtered domain. Our analysis of the Visual Information Fidelity (VIF) criterion shows that improvements in VIF include incorporation of a contrast comparison, in addition to the structure comparison in IFC. Our analysis attempts to unify quality metrics derived from different first principles and characterize the relative performance of different QA systems.
  • Keywords
    filtering theory; image processing; mean square error methods; contrast gain control; full reference image quality assessment; human visual system; information fidelity metric; mean squared error; monotonic function; structural similarity metric; sub-band filtered domain; Gain control; Humans; Image analysis; Image quality; Information analysis; Information filtering; Information filters; Performance analysis; Quality assessment; Visual system; Image quality; Quality assessment; Structural Similarity; Visual Information Fidelity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711976
  • Filename
    4711976