• DocumentCode
    1866723
  • Title

    Space compaction under generalized mergeability

  • Author

    Das, Sunil R. ; Petriu, Emil M. ; Barakat, Tony ; Assaf, Mansour H. ; Nayak, Amiya R.

  • Author_Institution
    Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
  • Volume
    1
  • fYear
    1998
  • fDate
    18-21 May 1998
  • Firstpage
    519
  • Abstract
    Generalized mergeability criteria for merging an arbitrary number of output sequences have been established under conditions of stochastic dependence and independence of line errors. In this paper, we report experimental results on ISCAS 85 benchmark circuits which were targeted for space compaction using these generalized mergeability criteria
  • Keywords
    built-in self test; design for testability; digital simulation; logic testing; performance evaluation; stochastic systems; ISCAS 85 benchmark circuits; VLSI; generalized mergeability; line errors; output sequences; space compaction; stochastic dependence; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Logic testing; Merging; Space technology; Stochastic processes; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
  • Conference_Location
    St. Paul, MN
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-4797-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1998.679842
  • Filename
    679842
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1866723