• DocumentCode
    186694
  • Title

    Package reliability and performance trends in an era of product integration

  • Author

    Jun He

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    Product differentiation is expected to accelerate and will encompass integration of product functionality into single and multiple die on package as well as multiple die/packages on board. Novel packaging designs will lead to incorporation of new materials and processes from which a comprehensive understanding of operating conditions at system and subcomponent level will be required to ensure reliability at minimum impact to cost & performance. Reliability tests, models and analysis must evolve to encompass emerging failure mechanisms and geometric effects not considered when standards were originally authored. This manuscript will show trends in packaging and materials along with examples of emerging failure mechanisms that need to be understood to ensure reliability in highly integrated products.
  • Keywords
    failure analysis; integrated circuit packaging; integrated circuit reliability; failure mechanisms; multiple die package; package reliability; product differentiation; product integration; reliability analysis; reliability model; reliability test; Failure analysis; Materials; Measurement; Packaging; Reliability; Standards; Stress; geometric scaling; knowledge based qualification; reliability modeling; system use conditions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6860605
  • Filename
    6860605