DocumentCode
186694
Title
Package reliability and performance trends in an era of product integration
Author
Jun He
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
2014
fDate
1-5 June 2014
Abstract
Product differentiation is expected to accelerate and will encompass integration of product functionality into single and multiple die on package as well as multiple die/packages on board. Novel packaging designs will lead to incorporation of new materials and processes from which a comprehensive understanding of operating conditions at system and subcomponent level will be required to ensure reliability at minimum impact to cost & performance. Reliability tests, models and analysis must evolve to encompass emerging failure mechanisms and geometric effects not considered when standards were originally authored. This manuscript will show trends in packaging and materials along with examples of emerging failure mechanisms that need to be understood to ensure reliability in highly integrated products.
Keywords
failure analysis; integrated circuit packaging; integrated circuit reliability; failure mechanisms; multiple die package; package reliability; product differentiation; product integration; reliability analysis; reliability model; reliability test; Failure analysis; Materials; Measurement; Packaging; Reliability; Standards; Stress; geometric scaling; knowledge based qualification; reliability modeling; system use conditions;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2014 IEEE International
Conference_Location
Waikoloa, HI
Type
conf
DOI
10.1109/IRPS.2014.6860605
Filename
6860605
Link To Document