Universality of NBTI - From devices to circuits and products

This paper showcases the universality of NBTI and its dependencies on time, bias, temperature, AC frequency and pulse duty cycle across different process integration schemes used in the industry and technology nodes. Strong correlation has been established between device, circuit, and product degradation. Different aspects of variability and variable NBTI in small area devices have been discussed. Features that are important from an industrial perspective are highlighted. Any NBTI model should address these aspects to be considered relevant.