• DocumentCode
    1869831
  • Title

    Methods for determining a maximum operating frequency for TTL gates

  • Author

    Lewis, Randall D. ; Awkward, Kenneth W.

  • Author_Institution
    Westinghouse Electr. Corp., Baltimore, MD, USA
  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    372
  • Lastpage
    377
  • Abstract
    Two methods for determining a realistic maximum operating frequency for TTL gates are developed. Both methods involve using propagation delay times and redefining them to valid TTL levels. The first method is a rigorous treatment of the subject, while the second is an easy-to-use rule of thumb. The exponential-linear method, which is extensively discussed, is slightly conservative. No devices tested during this study would have failed due to the maximum operating frequency (fMAX) computed using this technique. The linear-linear technique is less conservative; several devices in this study would have failed to meet fMAX requirements had this technique been used
  • Keywords
    failure analysis; logic circuits; reliability; transistor-transistor logic; TTL gates; exponential-linear method; failure analysis; linear-linear technique; logic gates; maximum operating frequency; propagation delay times; reliability; Circuit testing; Frequency; Integrated circuit testing; Laboratories; Logic devices; Maintenance; Manufacturing; Propagation delay; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1990. Proceedings., Annual
  • Conference_Location
    Los Angeles, CA
  • Type

    conf

  • DOI
    10.1109/ARMS.1990.67986
  • Filename
    67986