• DocumentCode
    1870891
  • Title

    EP printer jitter characterization using 2D Gabor filter and spectral analysis

  • Author

    Eid, Ahmed H. ; Ahmed, Mohamed N. ; Rippetoe, Edward E.

  • Author_Institution
    Lexmark Int. Inc., Lexington, KY
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1860
  • Lastpage
    1863
  • Abstract
    Electrophotographic (EP) printer banding and jitter defects are main sources of print quality degradation. Traditionally, the characterization of these defects relies mainly on the assumption that the defect has either horizontal or vertical orientation to permit the simple ID analysis of the defect profile. However, this assumption can easily be violated if a small amount of printer or scanner skew is introduced to the analyzed images. In some cases the defect can inherently be neither vertical nor horizontal. Unless the defect orientation has been accurately detected before analysis, the ID-based approaches could bias the estimation of the defect severity. In this paper, we present an approach to characterize the skewed jitter defects of unrestricted orientation using 2D-based analysis of Gabor pre-filtering and spectral analysis. Our experimental results show that the proposed approach provides an objective measure that quantifies the EP jitter defect, and correlates to the subjective assessment of print quality experts with a 0.96 correlation coefficient.
  • Keywords
    Gabor filters; electrophotography; image processing; jitter; printers; spectral analysis; 2D Gabor filter; EP printer jitter; Electrophotographic printer banding; defect orientation; defect severity; print quality degradation; skewed jitter defects; spectral analysis; unrestricted orientation; Degradation; Discrete Fourier transforms; Filter bank; Filtering; Frequency estimation; Gabor filters; Gears; Jitter; Printers; Spectral analysis; Defect; Gabor; banding; jitter; print;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4712141
  • Filename
    4712141