DocumentCode
1871497
Title
Designing self-exercising analogue checkers
Author
Kolarik, Vladimir ; Lubaszewski, Marcelo ; Courtois, Bernard
Author_Institution
TIMA/INPG, Grenoble, France
fYear
1994
fDate
25-28 Apr 1994
Firstpage
252
Lastpage
257
Abstract
The design of checkers suitable for concurrent error detection in analogue and mixed-signal circuits is addressed in this paper. These checkers can on-line test duplicated and fully differential analogue functional circuits and comply with existing digital self-checking parts. A test pattern generator for off-line testing of the checkers is proposed, which fully exercises their capability of signalling functional error occurrences
Keywords
analogue circuits; error detection; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; analogue circuits; concurrent error detection; duplicated circuits; fully differential circuits; functional error occurrences; mixed-signal circuits; offline testing; online test; self-exercising analogue checkers; test pattern generator; Analog-digital conversion; Automatic testing; Automotive engineering; Circuit faults; Circuit testing; Digital integrated circuits; Rail transportation; Safety; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292304
Filename
292304
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