• DocumentCode
    1871520
  • Title

    A 2D numerical study on the photo current density enhancement in silicon solar cells with optimized backside gratings

  • Author

    Wellenzohn, Markus ; Hainberger, Rainer

  • Author_Institution
    Health & Environ. Dept., AIT Austrian Inst. of Technol. GmbH, Vienna, Austria
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    In this work, we present a detailed numerical study on the optimization of the photo current density in silicon solar cells with rectangular aluminum backside gratings covered with a 100 nm thick SiO2 layer. The simulation method combines a 2D ray tracing algorithm with rigorous coupled wave analysis for calculating the grating diffraction efficiencies. The optimization was performed for gratings with period lengths ranging from 0.25 μm to 1.5 μm and modulation depths ranging from 25 nm to 400 nm under the assumption of normal light incidence. The flat front side is covered with an 80 nm thin silicon nitride anti-reflection coating. The simulations show that the optimum grating parameters resulting in a maximum photo current density strongly depend on the silicon thickness.
  • Keywords
    antireflection coatings; current density; diffraction gratings; numerical analysis; photoconductivity; photoemission; ray tracing; silicon compounds; solar cells; 2D numerical study; 2D ray tracing algorithm; SiO2; antireflection coating; flat front side; grating diffraction efficiencies; normal light incidence; optimized backside gratings; optimum grating parameters; photocurrent density enhancement; rectangular aluminum backside gratings; rigorous coupled wave analysis; size 0.25 mum to 1.5 mum; size 100 nm; size 80 nm; solar cells; Current density; Diffraction; Gratings; Photonics; Photovoltaic cells; Reflection; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186567
  • Filename
    6186567