An Algorithm for Reducing Test Suite Based on Interface Parameters

This paper presents an approach to eliminate a representative set of testing cases from a test suite but provide the same coverage as the entire test suite. This approach mainly is based on graph theory and maps the relationship between inputs and outputs of tested system into the bipartite graph. Using the properties of bipartite graph decompose the entire test suite into some small test suites so as to eliminate the redundant and obsolete test cases in the test suite. In this paper, we propose the definition, classification and properties related to the relationship between inputs and outputs and present an algorithm for the reduction and optimization of test suite. Finally, The reduction approach can reduce the size of test suite dramatically without reducing the coverage rate of test suite and enhance the efficiency of testing.