• DocumentCode
    1871882
  • Title

    On-line delay testing of digital circuits

  • Author

    Franco, Piero ; McCluskey, Edward J.

  • Author_Institution
    Center for Reliable Comput., Stanford Univ., CA, USA
  • fYear
    1994
  • fDate
    25-28 Apr 1994
  • Firstpage
    167
  • Lastpage
    173
  • Abstract
    A new technique for on-line checking of digital systems is proposed. It is shown that, under certain timing restrictions, an off-line delay-fault testing method called Stability Checking can be used for on-line checking. Efficient CMOS on-line Stability Checker designs are presented, and an algorithm for meeting timing restrictions is described. Benchmark results are shown. On-line Stability Checkers detect errors caused by most common reliability failures and transients, and are shown to perform almost as well as duplication at a fraction of the hardware cost. Since outputs are checked independently, good diagnosability is possible
  • Keywords
    CMOS integrated circuits; circuit reliability; combinatorial circuits; integrated logic circuits; logic testing; CMOS; diagnosability; digital circuits; off-line delay-fault testing method; on-line delay testing; reliability failures; stability checking; timing restrictions; transients; Algorithm design and analysis; Benchmark testing; Circuit stability; Circuit testing; Costs; Delay; Digital circuits; Digital systems; Hardware; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1994. Proceedings., 12th IEEE
  • Conference_Location
    Cherry Hill, NJ
  • Print_ISBN
    0-8186-5440-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1994.292318
  • Filename
    292318