• DocumentCode
    1872099
  • Title

    Extension of UML and its conversion to Petri nets for semiconductor manufacturing modeling

  • Author

    Jeng, MuDer ; Lu, WeiZhao

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Ocean Univ., Keeling, Taiwan
  • Volume
    3
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    3175
  • Lastpage
    3180
  • Abstract
    This paper presents a methodology and its software implementation that converts UML models to Petri nets for modeling semiconductor manufacturing systems. Three widely adopted techniques of UML, the class diagram, the sequence diagram, and the state diagram, are selected as the front-end models for the user. The sequence diagram is extended with the power of describing concurrency, synchronization, choice, and confluence. The system model as specified by the user using the class, extended sequence and state diagrams is automatically converted to Petri nets for system analysis or simulation using the proposed software tool. The proposed methodology differs from prior work in that (1) the sequence diagram is extended; (2) low-level and unmodified Petri nets are used, which are equipped with more analysis techniques; and (3) to model a system, the user does not have to directly construct Petri nets. The proposed methodology has been tested for semiconductor manufacturing modeling
  • Keywords
    Petri nets; semiconductor process modelling; specification languages; Petri nets; UML models; class diagram; concurrency; semiconductor manufacturing modeling; semiconductor manufacturing system; semiconductor manufacturing systems; sequence diagram; state diagram; synchronization; system analysis; Analytical models; Concurrent computing; Manufacturing systems; Petri nets; Power system modeling; Semiconductor device manufacture; Semiconductor device testing; Software tools; Unified modeling language; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 2002. Proceedings. ICRA '02. IEEE International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7272-7
  • Type

    conf

  • DOI
    10.1109/ROBOT.2002.1013715
  • Filename
    1013715