DocumentCode
1872275
Title
A new strategy for testing analog filters
Author
Vazquez, D. ; Rueda, A. ; Huertas, J.L.
Author_Institution
Centro Nacional de Microelectronica, Seville Univ., Spain
fYear
1994
fDate
25-28 Apr 1994
Firstpage
36
Lastpage
41
Abstract
A new strategy for testing analog filters is presented, based on the reevaluation of the transfer function followed by simple processing of the output signals. Taking advantage of the structural properties of some universal biquads, this new strategy consists in provoking pole-zero cancellation during the test mode, without eliminating information about parameters which determine the normal circuit operation. Although area overhead could seem high, it can be very small in many applications
Keywords
active filters; design for testability; integrated circuit testing; linear integrated circuits; poles and zeros; transfer functions; DFT strategy; analog filters; analogue ICs; output signal processing; pole-zero cancellation; testing strategy; transfer function; universal biquads; Adders; Circuit faults; Circuit testing; Fabrication; Filters; Integrated circuit layout; Process design; Signal generators; Signal processing; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292337
Filename
292337
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