• DocumentCode
    1872501
  • Title

    Parameter uncertainty in the Sandia Array Performance Model for flat-plate crystaline silicon modules

  • Author

    Hansen, Clifford ; Stein, Joshua ; Miller, Steven ; Boyson, William ; Kratochvil, Jay ; King, David L.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The Sandia Array Performance Model (SAPM) [1] describes the power performance of photovoltaic (PV) modules under variable irradiance and temperature conditions. Model parameters are estimated by regressions involving measured module voltage and current, module and air temperature, and solar irradiance. Measurements are made under test conditions chosen to isolate subsets of parameters and which improve the quality of the regression estimates. Uncertainty in model parameters results from uncertainty in each measurement as well as from the number of measurements. Uncertainty in model parameters can be propagated through the model to determine its effect on model output. In this paper we summarize the process for estimating uncertainty in model parameters for flat-plate, crystalline silicon (cSi) modules from measurements, present example results, and illustrate the effect of parameter uncertainty on model output. Finally, we comment on how analysis of parameter uncertainty can inform model developers about the presence and impacts of model uncertainty.
  • Keywords
    parameter estimation; photovoltaic cells; regression analysis; silicon; solar cell arrays; solar radiation; SAPM; Sandia array performance model; Si; air temperature; crystalline silicon modules; flat-plate crystaline silicon modules; model parameters; module current; module voltage; parameter analysis; parameter uncertainty; photovoltaic modules power performance; regression estimates; solar irradiance; test conditions; uncertainty estimation; variable irradiance conditions; variable temperature conditions; Correlation; Current measurement; Mathematical model; Temperature measurement; Uncertain systems; Uncertainty; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186607
  • Filename
    6186607