DocumentCode
1872542
Title
Assessing the reliability and degradation of ribbon in photovoltaic module
Author
Huang, Chiu-Hua ; Chih, Liu-De ; Chen, Yi-Chia ; Huang, Ming-Yuan ; Wu, Zhen-Cheng ; Ho, Shyuan-Jeng
Author_Institution
AU OPTRONICS Corp., Taichung, Taiwan
fYear
2011
fDate
19-24 June 2011
Abstract
Yellowing of modules represents the most evident visual defect. It appears on 98% of the plant modules and, for 63% of panels, it strongly covers their entire background tedlar. In order to see if this yellowing effects the output of the modules the surface oxidation composition and thickness were measured. This letter reports how AUO solar utilizes Highly Accelerated & Humidity Stress Test (HAST) to determine ribbon yellowing effect, and the expected surface oxidation composition. In the same time we identify the surface oxidation rate. The result indicates that ribbon yellowness is a result of surface oxidation, and the yellow appearance is only a cosmetic issue. Lead-free ribbons are more vulnerable to yellowing because lead does not build oxides, only Tin does. The higher concentration of Tin in lead-free solder suggests it will exhibit yellowing relatively faster and easier.
Keywords
humidity; oxidation; reliability; silver alloys; solar cells; solders; tin alloys; AUO solar; HAST; SnAg; highly accelerated & humidity stress test; lead-free ribbons; lead-free solder; photovoltaic module; plant modules; ribbon degradation; ribbon reliability; ribbon yellowing effect; surface oxidation composition; surface oxidation thickness; visual defect; Copper; Humidity; Lead; Life estimation; Oxidation; Stress; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186609
Filename
6186609
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