• DocumentCode
    1872542
  • Title

    Assessing the reliability and degradation of ribbon in photovoltaic module

  • Author

    Huang, Chiu-Hua ; Chih, Liu-De ; Chen, Yi-Chia ; Huang, Ming-Yuan ; Wu, Zhen-Cheng ; Ho, Shyuan-Jeng

  • Author_Institution
    AU OPTRONICS Corp., Taichung, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Yellowing of modules represents the most evident visual defect. It appears on 98% of the plant modules and, for 63% of panels, it strongly covers their entire background tedlar. In order to see if this yellowing effects the output of the modules the surface oxidation composition and thickness were measured. This letter reports how AUO solar utilizes Highly Accelerated & Humidity Stress Test (HAST) to determine ribbon yellowing effect, and the expected surface oxidation composition. In the same time we identify the surface oxidation rate. The result indicates that ribbon yellowness is a result of surface oxidation, and the yellow appearance is only a cosmetic issue. Lead-free ribbons are more vulnerable to yellowing because lead does not build oxides, only Tin does. The higher concentration of Tin in lead-free solder suggests it will exhibit yellowing relatively faster and easier.
  • Keywords
    humidity; oxidation; reliability; silver alloys; solar cells; solders; tin alloys; AUO solar; HAST; SnAg; highly accelerated & humidity stress test; lead-free ribbons; lead-free solder; photovoltaic module; plant modules; ribbon degradation; ribbon reliability; ribbon yellowing effect; surface oxidation composition; surface oxidation thickness; visual defect; Copper; Humidity; Lead; Life estimation; Oxidation; Stress; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186609
  • Filename
    6186609