DocumentCode
1873290
Title
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems - Title
fYear
2007
fDate
26-28 Sept. 2007
Abstract
The following topics are dealt with: VLSI; fault tolerance; defects; network-on-chip; system-on-chip; reliability analysis; fault injection; testing; design for testability; soft errors; semiconductor memories; storage system; and integrated circuit technologies.
Keywords
VLSI; design for testability; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit technology; integrated circuit testing; integrated memory circuits; network-on-chip; VLSI; defects; design for testability; fault injection; fault tolerance; integrated circuit technologies; network-on-chip; reliability analysis; semiconductor memories; soft errors; storage system; system-on-chip; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location
Rome
ISSN
1550-5774
Print_ISBN
978-0-7695-2885-4
Type
conf
DOI
10.1109/DFT.2007.1
Filename
4358361
Link To Document