Trends in MW-rated VSI technology and reliability for adjustable speed drives

Author

Hosoda, Hiromi ; Al Mamun, Md ; Yoshino, Teruo

Author_Institution

Drive Syst. Dept., Toshiba Mitsubishi-Electr. Ind. Syst. Corp. (TMEIC), Fuchu, Japan

fYear

2010

fDate

21-25 Feb. 2010

Firstpage

1261

Lastpage

1265

Abstract

In recent years, the drive equipment capacity has been developed to more than megawatt based on demands in various industries. High reliability is indispensable for such large scale equipment to make the total system reliability high. The paper reports trends of the voltage source inverter now applied to very large scale drive equipment. The paper also reports trends of the high capacity self-turn-off semiconductor devices and the inverter circuit configuration, which realize both large and reliable drive equipment. In the paper, reliability factors in manufacturing process of drive equipment are discussed and an example of field experiences is introduced.

Keywords

VLSI; integrated circuit reliability; invertors; power integrated circuits; variable speed drives; MW-eated VSI technology; adjustable speed drives; drive equipment capacity; inverter circuit configuration; reliability; self-turn-off semiconductor devices; very large scale drive equipment; voltage source inverter; Assembly; Circuit faults; Large-scale systems; Milling machines; Power system reliability; Production facilities; Pulse width modulation inverters; Samarium; Steel; Variable speed drives;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE

Conference_Location

Palm Springs, CA

ISSN

1048-2334

Print_ISBN

978-1-4244-4782-4

Electronic_ISBN

1048-2334

Type

conf

DOI

10.1109/APEC.2010.5433341

Filename

5433341