DocumentCode
1873738
Title
Low temperatures in RTP
Author
Gutt, Thomas
Author_Institution
Infineon Technol. AG, Munchen, Germany
fYear
2001
fDate
2001
Firstpage
270
Lastpage
271
Abstract
Even though RTP was originally designed for temperatures from 700 to 1200°C the processes with lower temperatures gain more and more importance. Steady state temperatures down to 300°C makes temperature control from 200°C necessary. This processes occur in silicon and in compound semiconductor production. In GaAs production low temperature processes are used for alloying metal to achieve lowest contact resistances. For this applications we used the graphite box supplied for the Mattson SHS2800CS. Together with the special low temperature pyrometer setup. Temperatures can be controlled down to 200°C. But the correct temperature profile is not easy to achieve. This is coming from the fact that the wafer can be heated rapidly, but not cooled rapidly. This will lead to a overshoot, 7°C in this specific example. To solve this problem a short open loop step was introduced. This method is used in production as a standard now. The alloying of the contacts for HBT and HEMT production using this methods will be presented.
Keywords
heterojunction bipolar transistors; high electron mobility transistors; process control; pyrometers; rapid thermal processing; temperature control; 200 to 300 degC; GaAs; HBT; HEMT; Mattson SHS2800CS; RTP; Si; low temperature processes; open loop step; overshoot; pyrometer; temperature control; Alloying; Control systems; Gallium arsenide; HEMTs; Heterojunction bipolar transistors; Open loop systems; Production; Silicon; Steady-state; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Thermal Processing of Semiconductors 9th Internationa Conference on RTP 2001
Print_ISBN
0-9638251-0-4
Type
conf
DOI
10.1109/RTP.2001.1013777
Filename
1013777
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