• DocumentCode
    1874786
  • Title

    Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits

  • Author

    Regazzoni, Francesco ; Eisenbarth, T. ; Grossschadl, J. ; Breveglieri, L.

  • Author_Institution
    Univ. of Lugano, Lugano
  • fYear
    2007
  • fDate
    26-28 Sept. 2007
  • Firstpage
    508
  • Lastpage
    516
  • Abstract
    Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, various schemes to protect cryptographic devices against such attacks have been devised and some implemented in practice. Almost all of these protection schemes target an individual side-channel attack and consequently, it is not obvious whether a scheme for protecting the device against one type of side- channel attacks may make the device more vulnerable to another type of side-channel attacks. We examine in this paper the possibility of such a negative impact for the case where fault detection circuitry is added to a device (to protect it against fault injection attacks) and analyze the resistance of the modified device to power attacks. To simplify the analysis we focus on only one component in the cryptographic device (namely, the S-box in the AES and Kasumi ciphers), and perform power attacks on the original implementation and on a modified implementation with an added parity check circuit. Our results show that the presence of the parity check circuitry has a negative impact on the resistance of the device to power analysis attacks.
  • Keywords
    cryptography; digital circuits; error detection codes; parity check codes; AES S-boxes; Kasumi ciphers; cryptographic s-boxes; error detection circuits; fault detection circuitry; fault injection attacks; parity check circuit; power analysis attacks; power attacks resistance; side-channel attacks; Circuit faults; Cryptography; Electrical fault detection; Energy consumption; Fault detection; Fault tolerant systems; Immune system; Mobile communication; Parity check codes; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
  • Conference_Location
    Rome
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-2885-4
  • Type

    conf

  • DOI
    10.1109/DFT.2007.61
  • Filename
    4358420