• DocumentCode
    1874981
  • Title

    Transformer´s capacitance effect on the operation of triangular-current shaped soft-switched converters

  • Author

    Zeltser, Ilya ; Ben-yaakov, Sam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    928
  • Lastpage
    934
  • Abstract
    This paper addresses the effect of the isolating transformer parasitic capacitor in soft switched converter topologies that apply triangular inductor current. When a transformer is included in the circuit, it will not only add (leakage) inductance to the converter but will also add capacitance. This capacitance will cause a partial resonance behavior and therefore may alter the voltage transfer ratio of the converter. The objective of this study was to analyze the effect of this capacitance on the behavior of Triangular Current Shaped (TCS) soft-switched converters. The isolated TCS converter was analyzed and the theoretical results were verified by simulations and experimentally at a 1kW power level. The analysis show that the transformer´s capacitance boosts the voltage gain of the converter, changes the shape of the inductor current and hence modifies the RMS value of the current. It was found though, that by proper design the RMS current (for same power level) may in fact be reduced and consequently, will result in lower conduction losses as compared to the case with no capacitor.
  • Keywords
    capacitors; current transformers; RMS current; partial resonance behavior; power 1 kW; transformer parasitic capacitor; transformers capacitance effect; triangular inductor current; triangular-current shaped soft-switched converters; voltage transfer ratio; Bridge circuits; Capacitors; Inductance; Inductors; Parasitic capacitance; Power electronics; Resonance; Switches; Switching converters; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433393
  • Filename
    5433393