DocumentCode

1875415

Title

A new column redundancy scheme for fast access time of 64-Mb DRAM

Author

Young-Hyun Jun ; Tae-Hoon Kim ; Jae-Sik Lee ; Seong-Jin Jang ; Hee-Gook Lee

Author_Institution

GoldStar Electron Central Research Laboratory

fYear

1993

fDate

3-6 May 1993

Firstpage

1937

Lastpage

1940

Keywords

CMOS process; CMOS technology; Circuits; Delay effects; Electrons; Fuses; Laboratories; Random access memory; Signal generators; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

Conference_Location

IEEE

Print_ISBN

0-7803-1281-3

Type

conf

Filename

693054