DocumentCode
1875768
Title
Polycrystalline Diamond RFMEMS Resonators with the Highest Quality Factors
Author
Sepulveda, N. ; Aslam, D.M. ; Sullivan, J.P.
Author_Institution
Department of Electrical and Computer Engineering, Michigan State University, E. Lansing, MI, USA
fYear
2006
fDate
2006
Firstpage
238
Lastpage
241
Abstract
This paper reports the highest quality factor (Q) of 116,000 for cantilever beams made from any polycrystalline material, which is also the highest Q for any resonator structure made of polycrystalline diamond (poly-C). These results also include the highest Q of 47,900 for a highly-doped (0.15 Ohm-cm) poly-C resonator structure. A study of the energy dissipation mechanisms was performed in order to understand what limits the Q in poly-C resonators. The results obtained in this work show a decrease in Q with increasing doping level and grain boundaries. The poly-C cantilevers were tested at different temperatures in order to identify a possible thermally activated relaxation process responsible for limiting the Q. The activation energy found for this defect relaxation process is about 1.9 eV. The structures were tested using piezoelectric actuation and light scattering-interferometer detection techniques described elsewhere [ 1].
Keywords
Chemical sensors; Doping; Energy dissipation; Grain boundaries; Micromechanical devices; Radiofrequency microelectromechanical systems; Resonant frequency; Structural beams; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
Conference_Location
Istanbul, Turkey
ISSN
1084-6999
Print_ISBN
0-7803-9475-5
Type
conf
DOI
10.1109/MEMSYS.2006.1627780
Filename
1627780
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