• DocumentCode
    1875768
  • Title

    Polycrystalline Diamond RFMEMS Resonators with the Highest Quality Factors

  • Author

    Sepulveda, N. ; Aslam, D.M. ; Sullivan, J.P.

  • Author_Institution
    Department of Electrical and Computer Engineering, Michigan State University, E. Lansing, MI, USA
  • fYear
    2006
  • fDate
    2006
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    This paper reports the highest quality factor (Q) of 116,000 for cantilever beams made from any polycrystalline material, which is also the highest Q for any resonator structure made of polycrystalline diamond (poly-C). These results also include the highest Q of 47,900 for a highly-doped (0.15 Ohm-cm) poly-C resonator structure. A study of the energy dissipation mechanisms was performed in order to understand what limits the Q in poly-C resonators. The results obtained in this work show a decrease in Q with increasing doping level and grain boundaries. The poly-C cantilevers were tested at different temperatures in order to identify a possible thermally activated relaxation process responsible for limiting the Q. The activation energy found for this defect relaxation process is about 1.9 eV. The structures were tested using piezoelectric actuation and light scattering-interferometer detection techniques described elsewhere [ 1].
  • Keywords
    Chemical sensors; Doping; Energy dissipation; Grain boundaries; Micromechanical devices; Radiofrequency microelectromechanical systems; Resonant frequency; Structural beams; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
  • Conference_Location
    Istanbul, Turkey
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-9475-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2006.1627780
  • Filename
    1627780