DocumentCode
1879749
Title
High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits
Author
Yang, K. ; David, G. ; Robertson, S. ; Whitaker, J.F. ; Katehi, L.P.B.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume
2
fYear
1998
fDate
7-12 June 1998
Firstpage
949
Abstract
A field mapping system based on external electrooptic sampling has been developed in order to determine all components of the electric near-field distribution of guided microwaves with high spatial resolution. The capabilities of the setup are demonstrated by 2D-measurements of normal and tangential fields in a microwave distribution network.
Keywords
electric field measurement; electro-optical effects; integrated circuit measurement; microwave integrated circuits; microwave measurement; 2D measurement; electric near-field distribution; guided microwaves; high-resolution electro-optic mapping; integrated microwave circuit; microwave distribution network; Antenna measurements; Circuit testing; Integrated circuit measurements; Laser beams; Optical beams; Optical sensors; Probes; Sampling methods; Spatial resolution; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location
Baltimore, MD, USA
ISSN
0149-645X
Print_ISBN
0-7803-4471-5
Type
conf
DOI
10.1109/MWSYM.1998.705148
Filename
705148
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