DocumentCode
1880380
Title
Ultrafast processes in quantum dot devices
Author
Borri, P. ; Langbein, W. ; Schneider, S. ; Woggon, U. ; Sellin, R.L. ; Ouyang, D. ; Bimberg, D.
Author_Institution
Experimentelle Phys. IIb, Dortmund Univ., Germany
fYear
2002
fDate
2002
Firstpage
59
Lastpage
62
Abstract
The dephasing time and the population relaxation dynamics of the excitonic ground-state transitions in an electrically-pumped semiconductor optical amplifier containing InGaAs/GaAs quantum dots as active medium are measured at 10K using a highly sensitive heterodyne technique. Electrical injection into the barrier region results in a pure dephasing of the excitonic transitions. Once the injected carriers have filled the electronic ground state, additional filling of the excited states creates multiexcitons that show a fast dephasing due to population relaxation.
Keywords
III-V semiconductors; excitons; gallium arsenide; indium compounds; semiconductor optical amplifiers; semiconductor quantum dots; InGaAs-GaAs; InGaAs/GaAs; active medium; barrier region; dephasing time; electrically-pumped semiconductor optical amplifier; excitonic ground-state transitions; heterodyne technique; multiexcitons; population relaxation; population relaxation dynamics; quantum dot devices; ultrafast processes; Atom optics; Electric variables measurement; Light scattering; Optical scattering; Particle scattering; Quantum dots; Spectroscopy; Stationary state; Time measurement; US Department of Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
ISSN
1092-8669
Print_ISBN
0-7803-7320-0
Type
conf
DOI
10.1109/ICIPRM.2002.1014104
Filename
1014104
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