• DocumentCode
    1880833
  • Title

    Measurement Techniques for Magnetic Characterization of Fe-Si Alloys

  • Author

    Permiakov, V. ; Dupre, L. ; Melkebeek, J. ; Tant, P. ; Driesen, J. ; Belmans, R.

  • Author_Institution
    EELAB-EESA, Ghent Univ., Gent
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    742
  • Lastpage
    746
  • Abstract
    Standard measurements techniques for magnetic characterization of Fe-Si steels are agreed upon in IEC 60404-2 and IEC 60404-3. Unfortunately, the standard methods are not capable to characterize the behaviour of magnetic materials under various complex magnetomechanical conditions, such as rotational magnetization, compressive and tensile stresses and plastic strains. Based on the standard measurement techniques, a more complex magnetic characterization of Fe-Si alloys at different conditions can be developed for better understanding of energy loss, and generally, energy conversion in electromagnetic devices. In this work, recent achievements in the methodical characterization of Fe-Si alloys at various combinations of magnetic conditions at externally applied uniaxial mechnical load are described
  • Keywords
    IEC standards; alloy steel; iron alloys; magnetic materials; magnetic variables measurement; magnetisation; magnetomechanical effects; silicon alloys; stress effects; Fe-Si; Fe-Si alloys; Fe-Si steels; IEC 60404-2; IEC 60404-3; compressive stress; electromagnetic devices; energy conversion; energy loss; magnetic characterization; magnetic materials; magnetomechanical conditions; plastic strains; rotational magnetization; tensile stress; uniaxial mechnical load; IEC standards; Magnetic field induced strain; Magnetic materials; Magnetization; Measurement standards; Measurement techniques; Plastics; Steel; Tensile strain; Tensile stress; Fe-Si alloys; energy loss; magnetization; measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328150
  • Filename
    4124428